Please use this identifier to cite or link to this item: https://doi.org/10.1007/s00339-012-7542-x
Title: Characterization of magnetostatic surface spin waves in magnetic thin films: Evaluation for microelectronic applications
Authors: Kwon, J.H.
Mukherjee, S.S.
Deorani, P.
Hayashi, M.
Yang, H. 
Issue Date: May-2013
Citation: Kwon, J.H., Mukherjee, S.S., Deorani, P., Hayashi, M., Yang, H. (2013-05). Characterization of magnetostatic surface spin waves in magnetic thin films: Evaluation for microelectronic applications. Applied Physics A: Materials Science and Processing 111 (2) : 369-378. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-012-7542-x
Abstract: The authors have investigated the possibility of utilizing spin waves for interchip and intrachip communications, and as logic elements using both simulations and experimental techniques. Through simulations it has been shown that the decay lengths of magnetostatic spin waves are affected most by the damping parameter, and least by the exchange stiffness constant. The damping and dispersion properties of spin waves limit the attenuation length to several tens of microns. Thus, we have ruled out the possibility of interchip communication via spin waves. Experimental techniques for the extraction of the dispersion relationship have also been demonstrated, along with experimental demonstrations of spin wave interference for amplitude modulation. The effectiveness of spin wave modulation through interference, along with the capability of determining the spin wave dispersion relationships electrically during the manufacturing and testing phase of chip production, may pave the way for using spin waves in analog computing wherein the circuitry required for performing similar functionality becomes prohibitive. © 2013 Springer-Verlag Berlin Heidelberg.
Source Title: Applied Physics A: Materials Science and Processing
URI: http://scholarbank.nus.edu.sg/handle/10635/55276
ISSN: 09478396
DOI: 10.1007/s00339-012-7542-x
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