Please use this identifier to cite or link to this item: https://doi.org/10.1143/JJAP.44.406
Title: Blocking impurities in organic light emitting device by inserting parylene interlayer
Authors: Ke, L.
Kumar, R.S.
Burden, A.P.
Chua, S.-J. 
Keywords: Impurity
Indium tin oxide
Organic light emitting device
Parylene
Secondary ion mass spectrometry
Issue Date: Jan-2005
Source: Ke, L., Kumar, R.S., Burden, A.P., Chua, S.-J. (2005-01). Blocking impurities in organic light emitting device by inserting parylene interlayer. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 44 (1 A) : 406-409. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.44.406
Abstract: Secondary-ion mass spectrometry is used to study ion diffusion from a substrate into an organic film, which is considered as one of the reasons for organic-light-emitting-device degradation and instability. Results show that a 1 μm-thick parylene layer inserted between an indium-tin-oxide (ITO) anode and a soda-lime glass substrate effectively controls the diffusion of sodium, potassium, silicon and sulphur ions from the substrate to the device. The effect is the same as that in the case of using a plastic substrate which is sodium- and potassium-free. Also a 3 nm-thick parylene layer grown in between an ITO anode and a hole transport layer (HTL) not only shows improvement in device performance, but also is capable of blocking impurities such as sodium, potassium, silicon and sulphur ions. This study shows that the use of a parylene layer is effective for controlling contamination coming from the substrate. ©2005 The Japan Society of Applied Physics.
Source Title: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
URI: http://scholarbank.nus.edu.sg/handle/10635/55219
ISSN: 00214922
DOI: 10.1143/JJAP.44.406
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

1
checked on Dec 6, 2017

WEB OF SCIENCETM
Citations

2
checked on Nov 21, 2017

Page view(s)

42
checked on Dec 10, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.