Please use this identifier to cite or link to this item:
https://doi.org/10.1063/1.1529301
| Title: | Add-on transmission attachments for the scanning electron microscope |
| Authors: | Khursheed, A. Karuppiah, N. Osterberg, M. Thong, J.T.L. |
| Issue Date: | Jan-2003 |
| Citation: | Khursheed, A., Karuppiah, N., Osterberg, M., Thong, J.T.L. (2003-01). Add-on transmission attachments for the scanning electron microscope. Review of Scientific Instruments 74 (1 I) : 134-140. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1529301 |
| Abstract: | The experimental and theoretical results for add-on transmission attachments developed for the scanning electron microscope (SEM) were discussed. The image resolution of a field emission SEM improved by an order of magnitude due to transmission lens attachment providing an image magnification of several million. A compact energy electron loss spectrometer attachment was also developed. |
| Source Title: | Review of Scientific Instruments |
| URI: | http://scholarbank.nus.edu.sg/handle/10635/54952 |
| ISSN: | 00346748 |
| DOI: | 10.1063/1.1529301 |
| Appears in Collections: | Staff Publications |
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