Add-on transmission attachments for the scanning electron microscope

Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1529301

Title:	Add-on transmission attachments for the scanning electron microscope
Authors:	Khursheed, A. Karuppiah, N. Osterberg, M. Thong, J.T.L.
Issue Date:	Jan-2003
Citation:	Khursheed, A., Karuppiah, N., Osterberg, M., Thong, J.T.L. (2003-01). Add-on transmission attachments for the scanning electron microscope. Review of Scientific Instruments 74 (1 I) : 134-140. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1529301
Abstract:	The experimental and theoretical results for add-on transmission attachments developed for the scanning electron microscope (SEM) were discussed. The image resolution of a field emission SEM improved by an order of magnitude due to transmission lens attachment providing an image magnification of several million. A compact energy electron loss spectrometer attachment was also developed.
Source Title:	Review of Scientific Instruments
URI:	http://scholarbank.nus.edu.sg/handle/10635/54952
ISSN:	00346748
DOI:	10.1063/1.1529301
Appears in Collections:	Staff Publications

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