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|Title:||Add-on transmission attachments for the scanning electron microscope|
|Authors:||Khursheed, A. |
|Citation:||Khursheed, A., Karuppiah, N., Osterberg, M., Thong, J.T.L. (2003-01). Add-on transmission attachments for the scanning electron microscope. Review of Scientific Instruments 74 (1 I) : 134-140. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1529301|
|Abstract:||The experimental and theoretical results for add-on transmission attachments developed for the scanning electron microscope (SEM) were discussed. The image resolution of a field emission SEM improved by an order of magnitude due to transmission lens attachment providing an image magnification of several million. A compact energy electron loss spectrometer attachment was also developed.|
|Source Title:||Review of Scientific Instruments|
|Appears in Collections:||Staff Publications|
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