Please use this identifier to cite or link to this item: https://doi.org/10.1109/TADVP.2008.923379
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dc.titleA semi-analytical approach for system-level electrical modeling of electronic packages with large number of vias
dc.contributor.authorOo, Z.Z.
dc.contributor.authorLiu, E.-X.
dc.contributor.authorLi, E.-P.
dc.contributor.authorWei, X.
dc.contributor.authorZhang, Y.
dc.contributor.authorTan, M.
dc.contributor.authorLi, L.-W.J.
dc.contributor.authorVahldieck, R.
dc.date.accessioned2014-06-17T02:35:41Z
dc.date.available2014-06-17T02:35:41Z
dc.date.issued2008-05
dc.identifier.citationOo, Z.Z., Liu, E.-X., Li, E.-P., Wei, X., Zhang, Y., Tan, M., Li, L.-W.J., Vahldieck, R. (2008-05). A semi-analytical approach for system-level electrical modeling of electronic packages with large number of vias. IEEE Transactions on Advanced Packaging 31 (2) : 267-274. ScholarBank@NUS Repository. https://doi.org/10.1109/TADVP.2008.923379
dc.identifier.issn15213323
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/54802
dc.description.abstractThis paper presents a semi-analytical approach for electrical performance modeling of complex electronic packages with multiple power/ ground planes and large number of vias. The method is based on the modal expansion technique and the method of moments. For the inner package domain with multiple power/ground planes and many vias, the modal expansion method is employed to compute the electromagnetic fields from which the multiport network parameters, e.g., the admittance matrix can be easily obtained. For the top/bottom domain of signal layers, the moment method is used to extract the equivalent resistance, inductance, capacitance, and conductance (RLCG) parameters. The equivalent circuit for the entire package is then generated by combining the results for both package domains. The equivalent circuit can be used in a SPICE-like simulator to study the signal and power integrity of an electronic package. Numerical examples demonstrate that the new approach is able to provide fast yet accurate signal and power integrity analysis of multilayered electronic packages. © 2008 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TADVP.2008.923379
dc.sourceScopus
dc.subjectElectronic package
dc.subjectModal expansion
dc.subjectPower integrity
dc.subjectSignal integrity
dc.subjectSystem-level modeling
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/TADVP.2008.923379
dc.description.sourcetitleIEEE Transactions on Advanced Packaging
dc.description.volume31
dc.description.issue2
dc.description.page267-274
dc.description.codenITAPF
dc.identifier.isiut000258768300004
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