Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/54478
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dc.titleA neural network approach to determining optimal inspection sampling size for CMM
dc.contributor.authorZhang, Y.F.
dc.contributor.authorNee, A.Y.C.
dc.contributor.authorFuh, J.Y.H.
dc.contributor.authorNeo, K.S.
dc.contributor.authorLoy, H.K.
dc.date.accessioned2014-06-16T09:31:34Z
dc.date.available2014-06-16T09:31:34Z
dc.date.issued1996
dc.identifier.citationZhang, Y.F.,Nee, A.Y.C.,Fuh, J.Y.H.,Neo, K.S.,Loy, H.K. (1996). A neural network approach to determining optimal inspection sampling size for CMM. Computer Integrated Manufacturing Systems 9 (3) : 161-169. ScholarBank@NUS Repository.
dc.identifier.issn09515240
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/54478
dc.description.abstractThis paper reports a neural network approach to determining the optimal inspection sampling size of 'hole' features using the Coordinate Measuring Machine (CMM). Factors which could affect sample size due to design, manufacturing, and measurement related factors, i.e. size, dimensional and geometrical tolerances, machining processes, and confidence levels, have been studied. Machining process type, size, and tolerance band have been identified as the known factors which may affect the sample size required. Experiments have been carried out to collect sampling size data versus the variation of these factors for different 'hole' features. The implicit correlation between the sample size and these factors, has been achieved by training a back-propagation neural network using the collected data. The neural network architecture is described, and the test of the trained neural network on a few new 'hole' features is presented to highlight the applicability of this approach. Copyright © 1996 Elsevier Science Ltd.
dc.sourceScopus
dc.subjectBack-propagation neural networks
dc.subjectCMM
dc.subjectSampling size
dc.subjectTolerance band
dc.typeArticle
dc.contributor.departmentMECHANICAL & PRODUCTION ENGINEERING
dc.description.sourcetitleComputer Integrated Manufacturing Systems
dc.description.volume9
dc.description.issue3
dc.description.page161-169
dc.description.codenCMASE
dc.identifier.isiutNOT_IN_WOS
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