Please use this identifier to cite or link to this item: https://doi.org/10.1109/TCAD.2004.826583
Title: A multiparameter moment-matching model-reduction approach for generating geometrically parameterized interconnect performance models
Authors: Daniel, L.
Siong, O.C.
Chay, L.S.
Lee, K.H. 
White, J.
Keywords: Integrated circuits interconnections
Interconnect synthesis
Modeling
Parameterized reduced-order systems
Reduced-order systems
Issue Date: May-2004
Source: Daniel, L., Siong, O.C., Chay, L.S., Lee, K.H., White, J. (2004-05). A multiparameter moment-matching model-reduction approach for generating geometrically parameterized interconnect performance models. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 23 (5) : 678-693. ScholarBank@NUS Repository. https://doi.org/10.1109/TCAD.2004.826583
Abstract: In this paper, we describe an approach for generating accurate geometrically parameterized integrated circuit interconnect models that are efficient enough for use in interconnect synthesis. The model-generation approach presented is automatic, and is based on a multiparameter moment matching model-reduction algorithm. A moment-matching theorem proof for the algorithm is derived, as well as a complexity analysis for the model-order growth. The effectiveness of the technique is tested using a capacitance extraction example, where the plate spacing is considered as the geometric parameter, and a multiline bus example, where both wire spacing and wire width are considered as geometric parameters. Experimental results demonstrate that the generated models accurately predict capacitance values for the capacitor example, and both delay and cross-talk effects over a reasonably wide range of spacing and width variation for the multiline bus example.
Source Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
URI: http://scholarbank.nus.edu.sg/handle/10635/54461
ISSN: 02780070
DOI: 10.1109/TCAD.2004.826583
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