Please use this identifier to cite or link to this item: https://doi.org/10.1016/0026-2714(95)00122-I
Title: A mixed Poisson model and its application to attribute testing data
Authors: Xie, W.
Xie, M. 
Goh, T.N. 
Issue Date: Feb-1996
Source: Xie, W., Xie, M., Goh, T.N. (1996-02). A mixed Poisson model and its application to attribute testing data. Microelectronics Reliability 36 (2) : 133-140. ScholarBank@NUS Repository. https://doi.org/10.1016/0026-2714(95)00122-I
Abstract: A two-component mixed Poisson distribution useful in modeling and analyzing of certain quality and reliability data is studied in this paper. Its statistical properties, physical interpretations, and some practical issues are discussed. The model generalizes a previously proposed model which describes a perfect process subject to random shocks. The approach of using the model and its application are highlighted using some actual data.
Source Title: Microelectronics Reliability
URI: http://scholarbank.nus.edu.sg/handle/10635/54388
ISSN: 00262714
DOI: 10.1016/0026-2714(95)00122-I
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

3
checked on Dec 7, 2017

WEB OF SCIENCETM
Citations

2
checked on Nov 23, 2017

Page view(s)

30
checked on Dec 11, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.