Please use this identifier to cite or link to this item: https://doi.org/10.1002/jnm.591
Title: A memory efficient testing scheme for combined field integral equation for solving scattering problems using adaptive integral method
Authors: Ng, T.H.
Ooi, B.L. 
Kooi, P.S. 
Keywords: Adaptive integral method
Combined field integral equation
Method of moment
Radar cross section
Issue Date: Nov-2005
Citation: Ng, T.H., Ooi, B.L., Kooi, P.S. (2005-11). A memory efficient testing scheme for combined field integral equation for solving scattering problems using adaptive integral method. International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 18 (6) : 457-468. ScholarBank@NUS Repository. https://doi.org/10.1002/jnm.591
Abstract: A new memory efficient testing procedure for method of moment (MoM) has been proposed for solving combined field integral equation (CFIE) using adaptive integral method (AIM) for closed perfect electric conductor (PEC) scatterers. CFIE is a linear combination of electric field integral equation (EFIE) and magnetic field integral equation (MFIE) and hence the iterative solution for CFIE requires the simultaneous evaluation of both EFIE and MFIE. Using AIM, the MoM testing procedure is obtained by interpolating the grid potentials, computed using fast Fourier transform (FFT), onto the testing functions. For EFIE. the same set of multipole coefficients of the basis functions can be used as the testing functions, without the need to store additional interpolation coefficients. In this paper, we propose a similar simple but efficient and accurate method for the testing procedure for the MFIE using the same multipole coefficients for the basis functions. This enables CFIE to be solved using the same memory resources as EFIE. The accuracy of the radar cross section (RCS) computed for various geometries using CFIE with the proposed testing procedure is shown to be as accurate as the existing method. Copyright © 2005 John Wiley & Sons, Ltd.
Source Title: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
URI: http://scholarbank.nus.edu.sg/handle/10635/54341
ISSN: 08943370
DOI: 10.1002/jnm.591
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