Please use this identifier to cite or link to this item: https://doi.org/10.1109/TR.2010.2103710
DC FieldValue
dc.titleA distribution-based systems reliability model under extreme shocks and natural degradation
dc.contributor.authorYe, Z.S.
dc.contributor.authorTang, L.C.
dc.contributor.authorXu, H.Y.
dc.date.accessioned2014-06-16T09:26:50Z
dc.date.available2014-06-16T09:26:50Z
dc.date.issued2011-03
dc.identifier.citationYe, Z.S., Tang, L.C., Xu, H.Y. (2011-03). A distribution-based systems reliability model under extreme shocks and natural degradation. IEEE Transactions on Reliability 60 (1) : 246-256. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2010.2103710
dc.identifier.issn00189529
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/54087
dc.description.abstractDegradation, and shock are two common mechanisms accounting for product failures. This paper presents a convenient means of capturing both shock and degradation in a single model when the extent of degradation and the magnitude of shocks are not observable, but only the failure times and the corresponding failure modes are recorded. We assume that the lifetime of a degradation-oriented failure, which is regarded as some initial random resource, belongs to some distribution family. Shocks arrive according to a non-homogeneous Poisson process, and the destructive probability depends on the transformed remaining resource of the system. Under these assumptions, we propose the single failure time model, and the recurrent event model. This study complements the well-known Brown-Proschan model. The single failure time model has successfully been applied to a real time data set. We also conduct a simulation study to examine the accuracy of our model. © 2010 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TR.2010.2103710
dc.sourceScopus
dc.subjectBrown-Proschan model
dc.subjectextreme shock
dc.subjecthazard potential
dc.subjectmultiple failure modes
dc.subjectnatural failure
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.doi10.1109/TR.2010.2103710
dc.description.sourcetitleIEEE Transactions on Reliability
dc.description.volume60
dc.description.issue1
dc.description.page246-256
dc.description.codenIEERA
dc.identifier.isiut000287861400026
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