Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1862337
Title: Tensile test of a single nanofiber using an atomic force microscope tip
Authors: Tan, E.P.S. 
Goh, C.N.
Sow, C.H. 
Lim, C.T. 
Issue Date: 14-Feb-2005
Citation: Tan, E.P.S., Goh, C.N., Sow, C.H., Lim, C.T. (2005-02-14). Tensile test of a single nanofiber using an atomic force microscope tip. Applied Physics Letters 86 (7) : 1-3. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1862337
Abstract: In this study, an approach using an atomic force microscope (AFM) tip to stretch a single electrospun polyethylene oxide (PEO) nanofiber is demonstrated. One end of the nanofiber is attached to a movable optical microscope stage and the other end of the nanofiber to a piezoresistive AFM cantilever tip. The nanofiber is stretched by moving the microscope stage and the force is measured via the deflection of the cantilever. The elastic modulus of PEO nanofiber is found to be about 45 MPa. © 2005 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/51533
ISSN: 00036951
DOI: 10.1063/1.1862337
Appears in Collections:Staff Publications

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