Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/50627
DC FieldValue
dc.titleImage retrieval based on multidimensional feature properties
dc.contributor.authorAng, Yew H.
dc.contributor.authorLi, Z.
dc.contributor.authorOng, Sim-Heng
dc.date.accessioned2014-04-23T03:01:44Z
dc.date.available2014-04-23T03:01:44Z
dc.date.issued1995
dc.identifier.citationAng, Yew H.,Li, Z.,Ong, Sim-Heng (1995). Image retrieval based on multidimensional feature properties. Proceedings of SPIE - The International Society for Optical Engineering 2420 : 47-57. ScholarBank@NUS Repository.
dc.identifier.isbn081941767X
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/50627
dc.description.abstractIn this paper, multidimensional feature measures of object shapes and feature blobs for retrieval of ceramic artifacts (e.g., plates, vases, and bowls) are proposed. These measures capture the various granularity of image features necessary for representation of complex image objects and their painted designs. Object shape is characterized by region compactness, boundary eccentricity, region moment, and region convexity. High detailed regions are characterized by blob properties such as total blob size, number of blobs, dispersion of blobs, and central moment of blobs. Each set of multiple feature measures jointly forms a 4- dimensional feature vector in a multidimensional feature space. Feature abstraction of complex image details is further improved by the computing feature measurements on sub-resolution images. This allows features of different perceptual scales to be isolated and efficiently abstracted. We have applied our method of image content analysis for retrieval of ceramic artifacts and have shown that multiresolution multidimensional feature measures can adequately retrieve images with high perceptual similarity.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentINSTITUTE OF SYSTEMS SCIENCE
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume2420
dc.description.page47-57
dc.description.codenPSISD
dc.identifier.isiutNOT_IN_WOS
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