Please use this identifier to cite or link to this item: https://doi.org/10.1109/20.538807
Title: Microcracks of the thin-film head alumina: "l" cracks and "u" cracks
Authors: Chekanov, A.S. 
Low, T.S. 
Alli, S. 
Kolosov, O.
Briggs, A.
Issue Date: 1996
Source: Chekanov, A.S., Low, T.S., Alli, S., Kolosov, O., Briggs, A. (1996). Microcracks of the thin-film head alumina: "l" cracks and "u" cracks. IEEE Transactions on Magnetics 32 (5 PART 1) : 3696-3698. ScholarBank@NUS Repository. https://doi.org/10.1109/20.538807
Abstract: Two different types of microcracks in thin film head alumina were observed : cracks initiated at the alumina edges growing toward the head pole tips and cracks initiated at the head pole tip area and growing towards the leading edge of the alumina. Thermally induced cracks may cause degradation of magnetic head read/write performance due to the damage of the pole tip gap or corrosion of the head pole tips. Data from Ultrasonic AFM (UFM) indicate the difference in the subsurface structure of the observed cracks of the alumina. © 1996 IEEE.
Source Title: IEEE Transactions on Magnetics
URI: http://scholarbank.nus.edu.sg/handle/10635/50577
ISSN: 00189464
DOI: 10.1109/20.538807
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

5
checked on Dec 7, 2017

WEB OF SCIENCETM
Citations

4
checked on Nov 23, 2017

Page view(s)

44
checked on Dec 11, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.