Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/50566
Title: Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
Authors: Yeo, S.P. 
Cheng, M. 
Keywords: Microwave measurement
Reflectometers
Issue Date: 14-Mar-1996
Source: Yeo, S.P.,Cheng, M. (1996-03-14). Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices. Electronics Letters 32 (6) : 565-566. ScholarBank@NUS Repository.
Abstract: An improved prototype of the multi-state four port reflectometer (which uses only two power detectors) is used for measuring the complex reflection coefficients of microwave devices. Laboratory tests indicate that the measurement uncertainties for the proposed instrument are within ±0.01 for magnitude and ±1.5° for phase.
Source Title: Electronics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/50566
ISSN: 00135194
Appears in Collections:Staff Publications

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