Please use this identifier to cite or link to this item: https://doi.org/10.1143/JJAP.43.7102
DC FieldValue
dc.titleLaser precision engineering of glass substrates
dc.contributor.authorLan, B.
dc.contributor.authorHong, M.-H.
dc.contributor.authorYe, K.-D.
dc.contributor.authorWang, Z.-B.
dc.contributor.authorCheng, S.-X.
dc.contributor.authorChong, T.-C.
dc.date.accessioned2013-07-23T09:24:14Z
dc.date.available2013-07-23T09:24:14Z
dc.date.issued2004
dc.identifier.citationLan, B., Hong, M.-H., Ye, K.-D., Wang, Z.-B., Cheng, S.-X., Chong, T.-C. (2004). Laser precision engineering of glass substrates. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 43 (10) : 7102-7106. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.43.7102
dc.identifier.issn00214922
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/43074
dc.description.abstractThe precise laser microfabrication of glass is a very challenging task due to the stress-induced microcracks generated during laser ablation. In this paper, the results of high-quality glass microfabrication by low-energy Nd:YAG laser (355 nm, 30ns) ablation and pocket scanning are presented. Pocket scanning involves the scanning of a laser beam along parallel overlapped paths with the last path forming structural edge, while conventional direct scanning involves the scanning of a beam just along single path to obtain the structure edge. It is found that cracks that formed around the edges by pocket scanning are significantly reduced in size compared with those formed by laser direct scanning. Minimum crack sizes of less than 10 μm have been obtained at optimized parameters. Ablation depth is also enhanced greatly by pocket scanning; it increases almost linearly with laser fluence and the number of scanning loops. There is no saturation of ablation depth as observed in laser direct scanning. This technique has high potential applications in glass precision engineering.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1143/JJAP.43.7102
dc.sourceScopus
dc.subjectAblation depth
dc.subjectCracks
dc.subjectGlass
dc.subjectLaser ablation
dc.subjectPocket scanning method
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentCOMPUTER SCIENCE
dc.description.doi10.1143/JJAP.43.7102
dc.description.sourcetitleJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
dc.description.volume43
dc.description.issue10
dc.description.page7102-7106
dc.description.codenJAPND
dc.identifier.isiut000224780300055
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.