Please use this identifier to cite or link to this item:
|Title:||Detecting pattern-based outliers|
Complete spatial randomness
|Citation:||Hu, T., Sung, S.Y. (2003). Detecting pattern-based outliers. Pattern Recognition Letters 24 (16) : 3059-3068. ScholarBank@NUS Repository. https://doi.org/10.1016/S0167-8655(03)00165-X|
|Abstract:||Outlier detection targets those exceptional data that deviate from the general pattern. Besides high density clustering, there is another pattern called low density regularity. Thus, there are two types of outliers w.r.t. them. We propose two techniques: one to identify the two patterns and the other to detect the corresponding outliers. © 2003 Elsevier B.V. All rights reserved.|
|Source Title:||Pattern Recognition Letters|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Feb 15, 2019
WEB OF SCIENCETM
checked on Jan 30, 2019
checked on Nov 24, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.