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|Title:||Detecting pattern-based outliers|
Complete spatial randomness
|Citation:||Hu, T., Sung, S.Y. (2003). Detecting pattern-based outliers. Pattern Recognition Letters 24 (16) : 3059-3068. ScholarBank@NUS Repository. https://doi.org/10.1016/S0167-8655(03)00165-X|
|Abstract:||Outlier detection targets those exceptional data that deviate from the general pattern. Besides high density clustering, there is another pattern called low density regularity. Thus, there are two types of outliers w.r.t. them. We propose two techniques: one to identify the two patterns and the other to detect the corresponding outliers. © 2003 Elsevier B.V. All rights reserved.|
|Source Title:||Pattern Recognition Letters|
|Appears in Collections:||Staff Publications|
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