Please use this identifier to cite or link to this item:
Title: Reliability and Aging Mechanisms of all-solid-state thin film lithium ion microbatteries
Authors: ZHU JING
Keywords: lithium ion batteries, all-solid-state thin film microbatteries, interfacial reliability, aging mechanisms, nanoindentation, scanning probe microscopy
Issue Date: 30-Jul-2012
Source: ZHU JING (2012-07-30). Reliability and Aging Mechanisms of all-solid-state thin film lithium ion microbatteries. ScholarBank@NUS Repository.
Abstract: All-solid-state thin film lithium ion microbatteries have received considerable interest due to their applications in precise electronic devices, including semiconductor chips, implanted medical instruments, and micro-electromechanical systems (MEMS). Since all these applications require longer battery life and higher energy density, a comprehensive study on aging mechanisms of lithium ion batteries is very necessary. In this study, magnetron sputtering has been used to fabricate thin film electrodes and microbatteries. Combining new-developed wedge indentation method and other experimental techniques, the relationship between capacity fading and the changes in interfacial adhesion, mechanical behavior as well as surface morphology has been established for different thin film anodes and cathodes, respectively. Additionally, the effects of charge/discharge rate and depth of discharge (DOD) on the degradation in interfacial reliability have been also investigated. Furthermore, local aging mechanisms of all-solid-state thin film batteries have been investigated at nano-scale using various Scanning Probe Microscopy (SPM) tecnquiues.
Appears in Collections:Ph.D Theses (Open)

Show full item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
ZHU JING.pdf10.12 MBAdobe PDF



Page view(s)

checked on Dec 11, 2017


checked on Dec 11, 2017

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.