Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/35814
Title: MODULATING BIFEO3 NANOCRYSTALLINE THIN FILMS THROUGH CHARGED DEFECTS.
Authors: KE QING QING
Keywords: BiFeO3, charged defects, oxygen vacancy, electron, electrical properties, impedance spectra
Issue Date: 3-Aug-2012
Source: KE QING QING (2012-08-03). MODULATING BIFEO3 NANOCRYSTALLINE THIN FILMS THROUGH CHARGED DEFECTS.. ScholarBank@NUS Repository.
Abstract: The multifunctional application of BiFeO3 has been largely hindered by high leakage current and serious polarization degradation, both of which are believed to relate to charged defects involved in BFO thin films. In this project, the effects of sequential charged defects on the electrical properties of BFO-based thin films are investigated. The detailed types of charged defects involved in the BFO-based thin film are identified as oxygen vacancies and hopping electrons, which are shown to play an important role in the enhancement of dielectric properties in the low frequency region. Moreover, the electric performances of BFO thin films such as conductive or fatigue behavior have been further investigated, in which several new and interesting anomalous behaviors (e.g. negative differential resistance, enhanced polarization and negative capacitance) have been observed and the corresponding mechanisms have been identified, giving some in-depth insight into the fundamental understanding of the charged defects involved.
URI: http://scholarbank.nus.edu.sg/handle/10635/35814
Appears in Collections:Ph.D Theses (Open)

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