Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/32749
Title: Scanning electron microscope
Authors: KHURSHEED, ANJAM 
Issue Date: 13-Nov-2007
Source: KHURSHEED, ANJAM (2007-11-13). Scanning electron microscope. ScholarBank@NUS Repository.
Abstract: In a scanning electron microscope, an emitted primary electron beam is diverted by an angle of at least about 45 degrees prior to incidence with a specimen. The beam may be bent by a magnetic separator. The separator may also serve to deflect secondary electron and back scattered electrons. As the angle of emissions and reflections from the specimen is close to the angle of incidence, bending the primary electron beam prior to incidence, allows the electron source to be located so as not to obstruct the travel of emissions and reflections to suitable detectors.
URI: http://scholarbank.nus.edu.sg/handle/10635/32749
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