Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/27765
Title: Synthesis and Ferroelectric / Dielectric properties of Pb(Mg1/3Ta2/3)1-xTixO3-Based Multilayered thin films
Authors: LI FANG
Keywords: Ferroelectric Thin Films, Multilayered Structures, Polarization Behavior
Issue Date: 24-Mar-2006
Source: LI FANG (2006-03-24). Synthesis and Ferroelectric / Dielectric properties of Pb(Mg1/3Ta2/3)1-xTixO3-Based Multilayered thin films. ScholarBank@NUS Repository.
Abstract: Pb(Mg1/3Ta2/3)1-xTixO3 thin films were synthesized via both sol-gel and radio frequency (RF) magnetron sputtering routes. Their ferroelectric and dielectric properties have been investigated. In particular, the thin films with morphotropic phase boundary composition of Pb(Mg1/3Ta2/3)0.7Ti0.3O3 (PMTT) have been systematically studied, whereby their unique ferroelectric and dielectric properties are demonstrated. To further improve the electrical behavior of these ferroelectric thin films, multilayered PbZr0.52Ti0.48O3/Pb(Mg1/3Ta2/3)0.7Ti0.3O3/PbZr0.52Ti0.48O3 (PZT/PMTT/PZT) thin films were successfully synthesized. The PMTT interlayer effectively suppressed the heterogeneous a??rosettea?? structure commonly formed in the sol-gel derived PZT thin films. As expected, the multilayered thin films showed rather different polarization behavior, as compared to those for the monolayer PZT thin films. Surface analyses were employed to correlate the unique ferroelectric properties and AC impedance behavior to the charge carriers in these multilayered thin films operating at varying temperatures.
URI: http://scholarbank.nus.edu.sg/handle/10635/27765
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