Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/27666
Title: Scanning probe microscope tips grown by a field-emission process
Authors: TAY BOON HAU, ARTHUR
Keywords: Field-emission, Scanning Probe Microscope, Nanowire Tips
Issue Date: 8-Sep-2004
Source: TAY BOON HAU, ARTHUR (2004-09-08). Scanning probe microscope tips grown by a field-emission process. ScholarBank@NUS Repository.
Abstract: This research studies the growth of a single nanowire on an atomic force microscope (AFM) tip using a field emission induced growth technique with an aim to produce ultra sharp tips with high aspect ratio that will provide better performance capabilities as compared to existing conventional tips. Single tungsten (W) and cobalt (Co) nanowires were grown on standard AFM tips and it was found that they are able to produce high resolution tapping mode AFM imaging, have good stability under prolonged use and better performance in profiling structures with steep sidewalls. The Co nanowire AFM tip can also be used in magnetic force microscopy (MFM) due to its magnetic property.
URI: http://scholarbank.nus.edu.sg/handle/10635/27666
Appears in Collections:Master's Theses (Open)

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00-Cover.pdf60.09 kBAdobe PDF

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01-Acknowledgements.pdf72.36 kBAdobe PDF

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02-Table of Contents.pdf103.54 kBAdobe PDF

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03-Summary.pdf69.37 kBAdobe PDF

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04-List of Nomenclature.pdf69.88 kBAdobe PDF

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05-List of Figures.pdf172.72 kBAdobe PDF

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06-List of Tables.pdf67.65 kBAdobe PDF

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07-Chapter1-Introduction.pdf104.6 kBAdobe PDF

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08-Chapter2-Literature Review.pdf4.79 MBAdobe PDF

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09-Chapter3-Growth of Nanowires by a FE Process.pdf1.52 MBAdobe PDF

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10-Chapter4-Growth of Single W Nanowire on AFM Tips.pdf4.17 MBAdobe PDF

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11-Chapter5-Growth of Single Co Nanowire on AFM Tips.pdf737.97 kBAdobe PDF

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12-Chapter6-Conclusion.pdf98.67 kBAdobe PDF

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13-References.pdf234.34 kBAdobe PDF

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14Appendix.pdf411.38 kBAdobe PDF

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