Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/16831
Title: High-resolution X-ray Diffraction Study of Phase and Domain Structures and Thermally-Induced Phase Transformations in PZN-(4.5-9)%PT
Authors: CHANG WEI SEA
Keywords: synchrotron diffraction, relaxor-ferroelectric single crystal, phase transformation, micro/nanotwin domains, morphotropic phase boundary, PZN-PT PZNPT
Issue Date: 13-Jul-2009
Source: CHANG WEI SEA (2009-07-13). High-resolution X-ray Diffraction Study of Phase and Domain Structures and Thermally-Induced Phase Transformations in PZN-(4.5-9)%PT. ScholarBank@NUS Repository.
Abstract: High-resolution synchrotron x-ray diffraction (HR-XRD) (002)pc reciprocal space mappings have been performed on unpoled (annealed) relaxor ferroelectric PZN-(4.5-9)percentPT single crystals. To avoid undesired surface effects produced by mechanical polishing, a fracturing technique has been devised to expose the relatively stress free crystal bulk for the HR-XRD study. Evidence for rhombohedral and tetragonal micro/nanotwins could be detected in the crystals. For PZN-4.5percentPT, the room temperature rhombohedral phase exhibits a broad diffraction in most instances, although microtwin diffractions could be detected in a few cases. The increased growth-and-transformation stresses in PZN-(6-8)percentPT promote the coexistence of rhombohedral and tetragonal micro/nanotwins at room temperature. The tetragonal phase in this case is metastable stabilized by the transformation-cum-cooling stress in the crystals. This accounts for the missing (001)T diffractions in the (001)-fractured surface. At room temperature, PZN-9percentPT consists predominantly of (110)-tetragonal micro/nanotwins. The effects of temperature on the phase stability of this material are also discussed.
URI: http://scholarbank.nus.edu.sg/handle/10635/16831
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