Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/15148
Title: Characterization of mechanical properties of tungsten nanowires
Authors: LI QI
Keywords: Field emission induced growth (FEIG) nanowire; atomic force microscope (AFM); lateral force microscope (LFM)
Issue Date: 16-Jan-2006
Source: LI QI (2006-01-16). Characterization of mechanical properties of tungsten nanowires. ScholarBank@NUS Repository.
Abstract: This project aims to develop the techniques to measure the Younga??s modulus of nanocrystalline tungsten nanowires grown by a field-emission induced growth technique, with the capability of examining the microstructure of the nanowire in a transmission electron microscope (TEM). Two techniques based on the scanning probe microscope were considered. The first uses lateral force measurements in which a tungsten nanowire grown on a standard atomic force microscope (AFM) tip is bent against the corner of a step, while the alternative method uses an AFM tip loading the midpoint of a suspended nanowire that is grown and aligned across a slot. The nanowire was annealed and the Younga??s modulus is found to be slightly higher than before annealing.
URI: http://scholarbank.nus.edu.sg/handle/10635/15148
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