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Title: | RELIABILITY OF CRYSTALLINE SILICON PHOTOVOLTAIC MODULES: A FOCUS ON POTENTIAL-INDUCED DEGRADATION | Authors: | LUO WEI | Keywords: | Photovoltaics, crystalline silicon, PV module reliability, bifacial PV technologies, potential-induced degradation, surface passivation degradation | Issue Date: | 26-Sep-2018 | Citation: | LUO WEI (2018-09-26). RELIABILITY OF CRYSTALLINE SILICON PHOTOVOLTAIC MODULES: A FOCUS ON POTENTIAL-INDUCED DEGRADATION. ScholarBank@NUS Repository. | Abstract: | Photovoltaic (PV) module reliability is critical for promoting PV into the electricity market. One of the most detrimental failure modes for crystalline silicon (c-Si) PV modules in the field is potential-induced degradation (PID) due to a high electrical potential difference appearing across the solar cells and module frames/ground. In the last decade, most of the PID-related research has focused on conventional p-type c-Si PV modules. However, the current PV market is more diversified and competitive than ever, with many new products being launched into the market. It is important to understand their PID sensitivity and underlying mechanisms to ensure 25 years lifetime or more outdoors. In particular, bifacial concepts are gaining huge momentum in both the solar industry and academia for their capability to generate power from the albedo. Therefore, this thesis focuses on the PID behavior of emerging bifacial c-Si PV technologies. | URI: | http://scholarbank.nus.edu.sg/handle/10635/151259 |
Appears in Collections: | Ph.D Theses (Open) |
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