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https://scholarbank.nus.edu.sg/handle/10635/14920
DC Field | Value | |
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dc.title | Characterization of hot carrier reliability in deep submicronmeter MOSFETs | |
dc.contributor.author | LIAO HONG | |
dc.date.accessioned | 2010-04-08T10:48:11Z | |
dc.date.available | 2010-04-08T10:48:11Z | |
dc.date.issued | 2005-11-16 | |
dc.identifier.citation | LIAO HONG (2005-11-16). Characterization of hot carrier reliability in deep submicronmeter MOSFETs. ScholarBank@NUS Repository. | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/14920 | |
dc.description.abstract | This research aims to advance the understanding of several key aspects of the device reliability of deep submicrometer CMOS devices.The impact of indium channel implantation on the current-voltage characteristics, gate oxide breakdown and hot carrier reliability of deep submicrometer n-MOSFET is studied in detail. The reliability of 0.18 um n-MOSFETs stressed under hot carrier injection and enhanced by substrate bias, is studied. The manipulation of high-energy tail electrons (HETEs) via substrate bias is used as a scientific tool to probe the fundamental mechanisms governing the interface and oxide degradation. New experimental evidence provides important insights into the basic mechanism responsible for the shift of the worst-case stress condition in scaled MOSFETs. The role of HETEs in the continued existence of the hot electron gate current and the impact of a non-local hot electron injection on the predominant source-side gate oxide degradation are studied. | |
dc.language.iso | en | |
dc.subject | MOSFET, hot carrier effect, reliability, gate oxide, interface, degradation | |
dc.type | Thesis | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.contributor.supervisor | LING CHUNG HO | |
dc.description.degree | Ph.D | |
dc.description.degreeconferred | DOCTOR OF PHILOSOPHY | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Ph.D Theses (Open) |
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LiaoH_00cover page.pdf | 6.7 kB | Adobe PDF | OPEN | None | View/Download | |
LiaoH_00table of contents.pdf | 167.31 kB | Adobe PDF | OPEN | None | View/Download | |
LiaoH_01Chap.pdf | 600.7 kB | Adobe PDF | OPEN | None | View/Download | |
LiaoH_02Chap.pdf | 619.13 kB | Adobe PDF | OPEN | None | View/Download | |
LiaoH_03Chap.pdf | 218.78 kB | Adobe PDF | OPEN | None | View/Download | |
LiaoH_04Chap.pdf | 641.42 kB | Adobe PDF | OPEN | None | View/Download | |
LiaoH_05Chap.pdf | 374.5 kB | Adobe PDF | OPEN | None | View/Download | |
LiaoH_06Chap.pdf | 38.57 kB | Adobe PDF | OPEN | None | View/Download | |
LiaoH_07publication list.pdf | 11.33 kB | Adobe PDF | OPEN | None | View/Download |
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