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Title: A study of properties and applications of control charts for high yield processes
Keywords: Statistical Process Control, Control Charts, High Quality Process, Run Length, Time Between Events Data, Sensitivity Improvement
Issue Date: 23-Jul-2004
Citation: PRIYA RANJAN SHARMA (2004-07-23). A study of properties and applications of control charts for high yield processes. ScholarBank@NUS Repository.
Abstract: Modern manufacturing processes with their low defect rate have made Shewhart Control charts for attributes of practically little use due to their dependence on sample size. This dissertation attempts to look at the alternative charting procedures, and decision taking approach to monitor the attribute data and to improve them to make them more efficient in todaya??s ever changing environment. Some application issues of attribute Statistical Process Control are discussed with emphasis on advanced charting and monitoring techniques. The robustness to parameter and distribution changes is presented along with comprehensive comparative studies to compare the performance of these new techniques with the existing techniques. Issue of optimal performance is addressed and a decision scheme is presented for improving the sensitivity of these charting methods.
Appears in Collections:Ph.D Theses (Open)

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