Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/13743
Title: A simulation and electrical characterization of the low-voltage LDMOSFET
Authors: TAN SWEE THIAN
Keywords: LDMOSFET, quasi-saturation effect, hot-carrier effect, differential gate capacitance technique, high-field phenomena
Issue Date: 23-Feb-2004
Source: TAN SWEE THIAN (2004-02-23). A simulation and electrical characterization of the low-voltage LDMOSFET. ScholarBank@NUS Repository.
Abstract: The characteristics of the low-voltage LDMOSFET and its associated high-field phenomena including the quasi-saturation and hot-carrier effects are studied through simulation and experimental results. Hot-carrier induced degradation in LDMOSFETs is studied by analyzing the current-voltage and high-frequency gate capacitance-voltage curves. Stress conditions corresponding to low and high Vg, in the presence of high Vd, were investigated. Monitors through current-voltage curves, for a low Vg stress, are ineffective. However, a greater change in the stressed gate capacitances is observed. Further, the differential gate capacitance technique, which allows revelation of the types of trapped charges, is shown to be a simple technique.
URI: http://scholarbank.nus.edu.sg/handle/10635/13743
Appears in Collections:Master's Theses (Open)

Show full item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
Chapter_0.pdf141.42 kBAdobe PDF

OPEN

NoneView/Download
Chapter_1.pdf195.63 kBAdobe PDF

OPEN

NoneView/Download
Chapter_2.pdf309.35 kBAdobe PDF

OPEN

NoneView/Download
Chapter_3.pdf325.4 kBAdobe PDF

OPEN

NoneView/Download
Chapter_4.pdf199.24 kBAdobe PDF

OPEN

NoneView/Download
Chapter_5.pdf252.14 kBAdobe PDF

OPEN

NoneView/Download
Chapter_6.pdf26.43 kBAdobe PDF

OPEN

NoneView/Download
AppendixA.pdf21.75 kBAdobe PDF

OPEN

NoneView/Download

Page view(s)

328
checked on Dec 11, 2017

Download(s)

1,952
checked on Dec 11, 2017

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.