Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/13739
Title: Modeling and analysis for control chart of defect data
Authors: HE BIN
Keywords: Control Chart, High Quality Process, Statistical Process Control, Hypothesis Testing, Defect Data, Data Modeling
Issue Date: 6-Feb-2004
Source: HE BIN (2004-02-06). Modeling and analysis for control chart of defect data. ScholarBank@NUS Repository.
Abstract: With the intensive competition in the current business world, sustaining and improving quality is very essential to all kinds of organizations. Statistical process control (SPC) is adopted to help maintain and improve the quality of products, and a large number of successful applications have been observed. However, the applicability of the traditional SPC has been challenged by high quality manufacturing processes due to inadequacy or inefficiency of the traditional SPC tools. The purpose of this research was to improve the applicability of the traditional SPC in the near zero-defect manufacturing environment. In order to minimize some of the problems encountered by the traditional SPC, some new data models, charting techniques, and decision-making procedures have been explored and evaluated.
URI: http://scholarbank.nus.edu.sg/handle/10635/13739
Appears in Collections:Ph.D Theses (Open)

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