Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/13551
Title: Fabrication and characterization of planar hall devices
Authors: MAY THU WIN
Keywords: magnetoresistance, planar Hall Effect , antiferromagnetic coupling , ferromagnetic coupling,
Issue Date: 2-Dec-2003
Source: MAY THU WIN (2003-12-02). Fabrication and characterization of planar hall devices. ScholarBank@NUS Repository.
Abstract: In this thesis, the effect of multilayer exchange coupling in magnetic multilayers has been investigated using a combination of magnetoresistance and planar Hall Effect measurements. The devices were fabricated using shadow mask technique and optical lithography. We have studied the magnetic properties as a function of spacer layer thickness in magnetic multilayer films using Vibrating Sample Magnetometer (VSM). We observed a transition from ferromagnetic to antiferromagnetic coupling as the thickness of the spacer layer was varied from 0 to 10 nm. We have also investigated the role of finite size on the transport properties of magnetic multilayers.
URI: http://scholarbank.nus.edu.sg/handle/10635/13551
Appears in Collections:Master's Theses (Open)

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