Please use this identifier to cite or link to this item: https://doi.org/10.1109/PVSC.2010.5616901
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dc.titleHigh efficiency silicon heterojunction solar cell using novel structure
dc.contributor.authorMueller, T.
dc.contributor.authorSchwertheiml, S.
dc.contributor.authorMuellerl, N.
dc.contributor.authorMeusinger, K.
dc.contributor.authorWdowiakl, B.
dc.contributor.authorGrewel, O.
dc.contributor.authorFahrner, W.
dc.date.accessioned2016-10-19T08:44:49Z
dc.date.available2016-10-19T08:44:49Z
dc.date.issued2010
dc.identifier.citationMueller, T.,Schwertheiml, S.,Muellerl, N.,Meusinger, K.,Wdowiakl, B.,Grewel, O.,Fahrner, W. (2010). High efficiency silicon heterojunction solar cell using novel structure. Conference Record of the IEEE Photovoltaic Specialists Conference : 683-688. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/PVSC.2010.5616901" target="_blank">https://doi.org/10.1109/PVSC.2010.5616901</a>
dc.identifier.isbn9781424458912
dc.identifier.issn01608371
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/128756
dc.description.abstractA novel approach for heterojunction silicon wafer solar cell fabrication is being investigated: This approach features nanocomposite plasma deposited amorphous silicon suboxides (a-SiO x:H) for high-quality surface passivation combined with overlaying plasma deposited doped microcrystalline silicon (μc-Si:H(p+)/μc-Si:H(n+)) for use as heterojunction emitter and back-surface-field. Special attention is paid (i) to the front and back surface passivation of the wafer by high-quality wide-gap amorphous silicon suboxides (a-SiO x:H), and (ii) to the influence of wide-gap high-quality μc-Si:H for use as emitter and back-surface-field (BSF). The p+ μc-Si:H films are likely to be suitable for use as emitter and BSF in a heterojunction solar cell device. They feature high transparency to suppress absorption, and high conductivity when annealed at the optimum temperature. Heterojunction solar cells fabricated by combining the excellent surface passivation properties of the intrinsic a-SiO x:H and the doped highly-transparent μc-Si:H layers show a drastic increase of the open-circuit voltage (up to 702 mV for n-type substrates). These high open-circuit voltages can be consistently attributed to the excellent surface passivation by a-SiO x:H preventing surface recombination at the hetero-interface. © 2010 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/PVSC.2010.5616901
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentSOLAR ENERGY RESEARCH INST OF S'PORE
dc.description.doi10.1109/PVSC.2010.5616901
dc.description.sourcetitleConference Record of the IEEE Photovoltaic Specialists Conference
dc.description.page683-688
dc.description.codenCRCND
dc.identifier.isiutNOT_IN_WOS
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