Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/12865
Title: Pulsed laser deposition and characterization of Pb(Zr, Ti)O3 and LaNiO3 thin films
Authors: YU YONGHE
Keywords: Films, PLD, PZT, LNO, XRD, piezoelectric
Issue Date: 28-Mar-2007
Source: YU YONGHE (2007-03-28). Pulsed laser deposition and characterization of Pb(Zr, Ti)O3 and LaNiO3 thin films. ScholarBank@NUS Repository.
Abstract: Highly (100) oriented Pb(Zr, Ti)O3 (PZT)/LaNiO3 (LNO) films and biaxially aligned LNO films on amorphous substrates were achieved using pulsed laser deposition (PLD). Distribution of the orientation axes of LNO and PZT films grown by PLD and its effect on ferroelectric properties were evaluated. Mechanisms of tilt in the orientation axes of the films produced by PLD and biaxially aligned films developed on amorphous surface by tilted substrate PLD were discussed. The residual stresses of the thin films on single crystal substrate were measured from the changes in curvature of the substrate, which was assessed using high-resolution X-ray rocking curve technique (HRRC). A new approach for determining X-ray elastic constants of thin films was developed based on the residual stresses measured by HRRC. X-ray diffraction with in-situ four-point bending was explored to measure both the in-plane Younga??s modulus and Poissona??s ratio of the crystalline films. New technique for measuring piezoelectric constants of thin films(both d33(f) and d31(f)) using X-ray diffraction was developed.
URI: http://scholarbank.nus.edu.sg/handle/10635/12865
Appears in Collections:Ph.D Theses (Open)

Show full item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
YuYH.pdf3.08 MBAdobe PDF

OPEN

NoneView/Download

Page view(s)

339
checked on Dec 18, 2017

Download(s)

551
checked on Dec 18, 2017

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.