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https://doi.org/10.1039/c4nr04184d
| Title: | Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors | Authors: | Zhou H. Kropelnicki P. Lee C. |
Issue Date: | 2015 | Publisher: | Royal Society of Chemistry | Citation: | Zhou H., Kropelnicki P., Lee C. (2015). Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors. Nanoscale 7 (2) : 532-541. ScholarBank@NUS Repository. https://doi.org/10.1039/c4nr04184d | Source Title: | Nanoscale | URI: | http://scholarbank.nus.edu.sg/handle/10635/127851 | ISSN: | 20403364 | DOI: | 10.1039/c4nr04184d |
| Appears in Collections: | Staff Publications |
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