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|Title:||Experimental characterization of the coherence properties of hard x-ray sources|
|Source:||Pelliccia, D., Nikulin, A.Y., Moser, H.O., Nugent, K.A. (2011-04-25). Experimental characterization of the coherence properties of hard x-ray sources. Optics Express 19 (9) : 8073-8078. ScholarBank@NUS Repository. https://doi.org/10.1364/OE.19.008073|
|Abstract:||The experimental characterization of the coherence properties of hard X-ray sources is reported and discussed. The source is described by its Mutual Optical Intensity (MOI). The coherent-mode decomposition is applied to the MOI described by a Gaussian-Schell model. The method allows for a direct, quantitative characterization of the degree of coherence of both synchrotron and laboratory sources. The latter represents the first example of characterizing a low coherence hard x-ray source. © 2011 Optical Society of America.|
|Source Title:||Optics Express|
|Appears in Collections:||Staff Publications|
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