Please use this identifier to cite or link to this item:
|Title:||Experimental characterization of the coherence properties of hard x-ray sources|
|Citation:||Pelliccia, D., Nikulin, A.Y., Moser, H.O., Nugent, K.A. (2011-04-25). Experimental characterization of the coherence properties of hard x-ray sources. Optics Express 19 (9) : 8073-8078. ScholarBank@NUS Repository. https://doi.org/10.1364/OE.19.008073|
|Abstract:||The experimental characterization of the coherence properties of hard X-ray sources is reported and discussed. The source is described by its Mutual Optical Intensity (MOI). The coherent-mode decomposition is applied to the MOI described by a Gaussian-Schell model. The method allows for a direct, quantitative characterization of the degree of coherence of both synchrotron and laboratory sources. The latter represents the first example of characterizing a low coherence hard x-ray source. © 2011 Optical Society of America.|
|Source Title:||Optics Express|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Aug 16, 2018
WEB OF SCIENCETM
checked on Jul 24, 2018
checked on Jun 22, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.