Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films

Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1555365

Title:	Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films
Authors:	Nie, H.B. Ong, C.K. Wang, J.P. Li, Z.W.
Issue Date:	15-May-2003
Citation:	Nie, H.B., Ong, C.K., Wang, J.P., Li, Z.W. (2003-05-15). Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films. Journal of Applied Physics 93 (10 2) : 7252-7254. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1555365
Abstract:	The evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films was studied. The magnetic properties, crystalline structures, microstructures, and surface morphologies of the as-deposited sample were characterized by using angle resolved M-H loops tracer, VSM, XRD, TEM, AES, and AFM. Magnetostatic and interface anisotropies may be the major reasons to cause biaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is the dominant one.
Source Title:	Journal of Applied Physics
URI:	http://scholarbank.nus.edu.sg/handle/10635/116074
ISSN:	00218979
DOI:	10.1063/1.1555365
Appears in Collections:	Staff Publications

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