Please use this identifier to cite or link to this item: https://doi.org/10.1109/VTSA.2009.5159316
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dc.titleA new robust non-local algorithm for band-to-band tunneling simulation and its application to tunnel-FET
dc.contributor.authorShen, C.
dc.contributor.authorYang, L.T.
dc.contributor.authorToh, E.-H.
dc.contributor.authorHeng, C.-H.
dc.contributor.authorSamudra, G.S.
dc.contributor.authorYeo, Y.-C.
dc.date.accessioned2014-12-02T08:05:49Z
dc.date.available2014-12-02T08:05:49Z
dc.date.issued2009
dc.identifier.citationShen, C., Yang, L.T., Toh, E.-H., Heng, C.-H., Samudra, G.S., Yeo, Y.-C. (2009). A new robust non-local algorithm for band-to-band tunneling simulation and its application to tunnel-FET. International Symposium on VLSI Technology, Systems, and Applications, Proceedings : 113-114. ScholarBank@NUS Repository. https://doi.org/10.1109/VTSA.2009.5159316
dc.identifier.isbn9781424427857
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/114537
dc.description.abstractA new non-local algorithm for accurately calculating the band-to-band tunneling current suitable for TCAD semiconductor simulators is proposed in this abstract. The proposed algorithm captures the essential physics of multi-dimensional tunneling in a 2D structure, and is designed to be robust and to achieve independence on the mesh grid. The new algorithm enables accurate modeling of T-FET and investigation of its device physics. Application on T-FET is demonstrated. The physical origin of the saturation of Id-V d curve of T-FET is analyzed and clarified for the first time. ©2009 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/VTSA.2009.5159316
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/VTSA.2009.5159316
dc.description.sourcetitleInternational Symposium on VLSI Technology, Systems, and Applications, Proceedings
dc.description.page113-114
dc.identifier.isiut000272451000050
Appears in Collections:Staff Publications

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