Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.optlastec.2004.02.005
Title: Polarisation interferometry flying height testing
Authors: Liu, X.
Clegg, W.
Liu, B. 
Keywords: Flying height
Polarisation interferometry
Refractive index determination
Issue Date: Feb-2005
Citation: Liu, X., Clegg, W., Liu, B. (2005-02). Polarisation interferometry flying height testing. Optics and Laser Technology 37 (1) : 21-27. ScholarBank@NUS Repository. https://doi.org/10.1016/j.optlastec.2004.02.005
Abstract: The in-depth analyses of polarisation interferometry flying height testing are presented. The drawbacks of the oblique incidence polarisation interferometry method are discussed. The application of the dual-beam normal incidence polarisation interferometry method is illustrated. It is shown that with this normal incidence polarisation interferometer, not only the flying height can be measured down to contact without losing accuracy, but the optical parameters of the head-slider can also be determined. © 2004 Elsevier Ltd. All rights reserved.
Source Title: Optics and Laser Technology
URI: http://scholarbank.nus.edu.sg/handle/10635/112720
ISSN: 00303992
DOI: 10.1016/j.optlastec.2004.02.005
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