Please use this identifier to cite or link to this item: https://doi.org/10.1109/20.800857
Title: Normal incidence polarization interferometer for measuring flying height of magnetic heads
Authors: Liu, X.
Clegg, W.
Liu, B. 
Keywords: Flying height
Head-disk-interface
Normal incidence polarization interferometry
Slider dynamics
Issue Date: 1999
Citation: Liu, X., Clegg, W., Liu, B. (1999). Normal incidence polarization interferometer for measuring flying height of magnetic heads. IEEE Transactions on Magnetics 35 (5 PART 1) : 2457-2459. ScholarBank@NUS Repository. https://doi.org/10.1109/20.800857
Abstract: In this paper, we give a brief review and analysis to the two currently most powerful methods for flying height testing of magnetic heads - intensity interferometry and polarization interferometry. Then a dual-beam normal incidence polarization interferometry method is proposed to compromise the disadvantages of the above two methods. The proposed method not only has the advantages of both the above methods, but also can be used to measure the pitch and roll of the head-slider dynamically. Design details and analysis of the relationship between the optical parameters of the tester and its testing accuracy are given. © 1999 IEEE.
Source Title: IEEE Transactions on Magnetics
URI: http://scholarbank.nus.edu.sg/handle/10635/112719
ISSN: 00189464
DOI: 10.1109/20.800857
Appears in Collections:Staff Publications

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