Please use this identifier to cite or link to this item: https://doi.org/10.1021/jp710722s
Title: Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigations of molecular orientation of copper(II) phthalocyanine thin films at organic heterojunction interfaces
Authors: Chen, W. 
Huang, H. 
Chen, S. 
Gao, X.Y. 
Wee, A.T.S. 
Issue Date: 3-Apr-2008
Citation: Chen, W., Huang, H., Chen, S., Gao, X.Y., Wee, A.T.S. (2008-04-03). Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigations of molecular orientation of copper(II) phthalocyanine thin films at organic heterojunction interfaces. Journal of Physical Chemistry C 112 (13) : 5036-5042. ScholarBank@NUS Repository. https://doi.org/10.1021/jp710722s
Abstract: Controlling the molecular orientation in p-n organic heterostructures is one of the key challenges in organic electronics that needs to be solved to improve device performance. In situ low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure measurements are used to investigate the molecular orientation of copper(II) phthalocyanine (CuPc) thin films at the interface of a p-n organic heterojunction comprising CuPc on top of 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA). It is found that CuPc molecules adsorb flat on lying-down PTCDA thin films with their π-conjugated molecular plane parallel to the substrate surfaces. The preferential orientation of CuPc thin films is determined by the directional π-π interaction at the CuPc/PTCDA interface, which also gives rise to the lying-down configuration of CuPc thin films on highly ordered pyrolytic graphite. © 2008 American Chemical Society.
Source Title: Journal of Physical Chemistry C
URI: http://scholarbank.nus.edu.sg/handle/10635/112611
ISSN: 19327447
DOI: 10.1021/jp710722s
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