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|Title:||Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigations of molecular orientation of copper(II) phthalocyanine thin films at organic heterojunction interfaces|
|Authors:||Chen, W. |
|Citation:||Chen, W., Huang, H., Chen, S., Gao, X.Y., Wee, A.T.S. (2008-04-03). Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigations of molecular orientation of copper(II) phthalocyanine thin films at organic heterojunction interfaces. Journal of Physical Chemistry C 112 (13) : 5036-5042. ScholarBank@NUS Repository. https://doi.org/10.1021/jp710722s|
|Abstract:||Controlling the molecular orientation in p-n organic heterostructures is one of the key challenges in organic electronics that needs to be solved to improve device performance. In situ low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure measurements are used to investigate the molecular orientation of copper(II) phthalocyanine (CuPc) thin films at the interface of a p-n organic heterojunction comprising CuPc on top of 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA). It is found that CuPc molecules adsorb flat on lying-down PTCDA thin films with their π-conjugated molecular plane parallel to the substrate surfaces. The preferential orientation of CuPc thin films is determined by the directional π-π interaction at the CuPc/PTCDA interface, which also gives rise to the lying-down configuration of CuPc thin films on highly ordered pyrolytic graphite. © 2008 American Chemical Society.|
|Source Title:||Journal of Physical Chemistry C|
|Appears in Collections:||Staff Publications|
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