Please use this identifier to cite or link to this item:
https://doi.org/10.1109/TMTT.2006.871948
DC Field | Value | |
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dc.title | Erratum: Error correction for diffraction and multiple scattering in free-space microwave measurement of materials (IEEE Transactions on Microwave Theory and Techniques (2006) 54:2 (648-659)) | |
dc.contributor.author | Hock, K.M. | |
dc.date.accessioned | 2014-11-28T01:54:47Z | |
dc.date.available | 2014-11-28T01:54:47Z | |
dc.date.issued | 2006-04 | |
dc.identifier.citation | Hock, K.M. (2006-04). Erratum: Error correction for diffraction and multiple scattering in free-space microwave measurement of materials (IEEE Transactions on Microwave Theory and Techniques (2006) 54:2 (648-659)). IEEE Transactions on Microwave Theory and Techniques 54 (4) : 1631-. ScholarBank@NUS Repository. https://doi.org/10.1109/TMTT.2006.871948 | |
dc.identifier.issn | 00189480 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/111661 | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TMTT.2006.871948 | |
dc.source | Scopus | |
dc.type | Others | |
dc.contributor.department | TEMASEK LABORATORIES | |
dc.description.doi | 10.1109/TMTT.2006.871948 | |
dc.description.sourcetitle | IEEE Transactions on Microwave Theory and Techniques | |
dc.description.volume | 54 | |
dc.description.issue | 4 | |
dc.description.page | 1631- | |
dc.description.coden | IETMA | |
dc.identifier.isiut | 000236889900041 | |
Appears in Collections: | Staff Publications |
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