Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/107213
Title: Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering
Authors: Chow, G.M. 
Goh, W.C. 
Hwu, Y.K.
Cho, T.S.
Je, J.H.
Lee, H.H.
Kang, H.C.
Noh, D.Y.
Lin, C.K.
Chang, W.D.
Issue Date: 18-Oct-1999
Citation: Chow, G.M.,Goh, W.C.,Hwu, Y.K.,Cho, T.S.,Je, J.H.,Lee, H.H.,Kang, H.C.,Noh, D.Y.,Lin, C.K.,Chang, W.D. (1999-10-18). Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering. Applied Physics Letters 75 (16) : 2503-2505. ScholarBank@NUS Repository.
Abstract: Conventional x-ray diffraction failed to provide correct information on alloying of materials made of elements with close lattice parameters, even for elements commonly accepted to have miscibility. Using anomalous x-ray scattering, we showed that nanostructured NiCo films did not necessarily form solid solution as expected from their phase diagram or suggested by the results of conventional x-ray diffraction. © 1999 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/107213
ISSN: 00036951
Appears in Collections:Staff Publications

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