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|Title:||Ferroelectric properties and leakage current characteristics of radio-frequency-sputtered SrBi2(V0.1Nb0.9) 2O9 thin films|
|Source:||Ezhilvalavan, S., Samper, V., Seng, T.W., Junmin, X., Wang, J. (2004-08-15). Ferroelectric properties and leakage current characteristics of radio-frequency-sputtered SrBi2(V0.1Nb0.9) 2O9 thin films. Journal of Applied Physics 96 (4) : 2181-2185. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1766096|
|Abstract:||The ferroelectric properties and leakage current mechanisms of polycrystalline SrBi2(V0.1Nb0.9) 2O9 (SBVN) thin films deposited on Pt/SiO2/n-Si substrate were investigated, using rf-magnetron sputtering and annealing in air. The SBVN films showed ferroelectric properties in terms of a large remnant polarization. The sputtered films exhibited a dense, crystallized microstructure, which had random orientations and smooth surface were also investigated. The results show that an improved ferroelectric and leakage current characteristics obtained at the low processing temperature are attributed to the larger polarizability.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
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