Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/105066
DC Field | Value | |
---|---|---|
dc.title | Computing average run lengths of exponential EWMA charts | |
dc.contributor.author | Gan, F.F. | |
dc.contributor.author | Chang, T.C. | |
dc.date.accessioned | 2014-10-28T05:11:00Z | |
dc.date.available | 2014-10-28T05:11:00Z | |
dc.date.issued | 2000 | |
dc.identifier.citation | Gan, F.F.,Chang, T.C. (2000). Computing average run lengths of exponential EWMA charts. Journal of Quality Technology 32 (2) : 183-187. ScholarBank@NUS Repository. | |
dc.identifier.issn | 00224065 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/105066 | |
dc.description.abstract | An exponential EWMA chart is useful for monitoring the mean β of interarrival times of nonconforming items in many manufacturing processes. A program is presented for determining the average run length (ARL) profiles of one-sided or two-sided EWMA charts. The ARL is computed using an exact procedure. The ARL's over a range of β's can be obtained given the chart parameters. The ARL profiles provide a more comprehensive understanding of the performance of a chart. | |
dc.source | Scopus | |
dc.subject | Average Run Length | |
dc.subject | Exponential Distribution | |
dc.subject | Poisson Distribution | |
dc.subject | Statistical Process Control | |
dc.type | Article | |
dc.contributor.department | STATISTICS & APPLIED PROBABILITY | |
dc.description.sourcetitle | Journal of Quality Technology | |
dc.description.volume | 32 | |
dc.description.issue | 2 | |
dc.description.page | 183-187 | |
dc.description.coden | JQUTA | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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