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|Title:||Computing average run lengths of exponential EWMA charts|
|Authors:||Gan, F.F. |
|Keywords:||Average Run Length|
Statistical Process Control
|Source:||Gan, F.F.,Chang, T.C. (2000). Computing average run lengths of exponential EWMA charts. Journal of Quality Technology 32 (2) : 183-187. ScholarBank@NUS Repository.|
|Abstract:||An exponential EWMA chart is useful for monitoring the mean β of interarrival times of nonconforming items in many manufacturing processes. A program is presented for determining the average run length (ARL) profiles of one-sided or two-sided EWMA charts. The ARL is computed using an exact procedure. The ARL's over a range of β's can be obtained given the chart parameters. The ARL profiles provide a more comprehensive understanding of the performance of a chart.|
|Source Title:||Journal of Quality Technology|
|Appears in Collections:||Staff Publications|
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