Please use this identifier to cite or link to this item: https://doi.org/10.1137/120888302
Title: Recovering over-/underexposed regions in photographs
Authors: Hou, L.
Ji, H. 
Shen, Z. 
Keywords: Contrast enhancement
Image inpainting
Sparse approximation
Tight frame
Wavelet
Issue Date: 12-Nov-2013
Citation: Hou, L., Ji, H., Shen, Z. (2013-11-12). Recovering over-/underexposed regions in photographs. SIAM Journal on Imaging Sciences 6 (4) : 2213-2235. ScholarBank@NUS Repository. https://doi.org/10.1137/120888302
Abstract: When taking pictures using a commodity camera in a scene with strong or harsh lighting, such as a sunny day outdoors, we often see a loss of highlight details (overexposure) in some bright regions and a loss of shadow details (underexposure) in some dark regions. In this paper, we develop a wavelet tight frame-based approach to reconstruct a well-exposed image with better visibility of details than that with over-/underexposed regions. There are two modules in the proposed approach: one in lightness channels that inpaints the clipped lightness and adjusts image contrast, and the other in chromatic channels that inpaints the saturated color regions. The experiments show that our method can effectively repair over-/underexposed regions, and it performs better than other existing methods on tested real photographs. © 2013 Society for Industrial and Applied Mathematics.
Source Title: SIAM Journal on Imaging Sciences
URI: http://scholarbank.nus.edu.sg/handle/10635/104036
ISSN: 19364954
DOI: 10.1137/120888302
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

14
checked on Oct 17, 2018

WEB OF SCIENCETM
Citations

9
checked on Oct 9, 2018

Page view(s)

38
checked on Oct 5, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.