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Zhisheng Ye

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Full Name
Zhisheng Ye
Variants
Ye Z.-S
Ye, Zhisheng
Ye, Zhi-Sheng
 
Main Affiliation
 
Faculty
 
Email
iseyezh@nus.edu.sg
 

Publications

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Date Issued:  [2010 TO 2018]

Results 1-16 of 16 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
122-Feb-2018Analysis of Field Return Data With Failed-But-Not-Reported EventsXin Wang; Zhi-sheng Ye ; Yili Hong; Loon Ching Tang 
26-Jul-2017Closed-Form Estimators for the Gamma Distribution Derived from Likelihood EquationsZhisheng Ye ; Nan Chen 
316-May-2015Condition-based maintenance using the inverse Gaussian degradation modelChen, Nan ; Ye, Zhisheng ; Xiang, Yisha; Zhang, Linmiao
42015Condition-based maintenance using the inverse Gaussian degradation modelChen N. ; Ye Z.-S ; Xiang Y.; Zhang L. 
55-Jun-2018Degradation in Common Dynamic EnvironmentsQingqing Zhai ; Zhi-sheng Ye 
631-Jan-2017Estimation of Field Reliability Based on Aggregate Lifetime DataPiao Chen ; Zhisheng Ye 
72015Inference on the Weibull distribution based on record valuesWang, Bing Xing; Ye, Zhi-Sheng 
816-Nov-2016Interval Estimation for k-out-of-n Load-Sharing SystemsYaonan Kong ; Zhisheng Ye 
917-Dec-2018Interval Estimation for Wiener Processes Based on Accelerated Degradation Test DataLanqing HONG ; Zhi-sheng Ye ; Josephine Sari
1011-Sep-2018Joint Online RUL Prediction for Multivariate Deteriorating SystemsPENG WEIWEN ; YE ZHISHENG ; CHEN NAN 
118-Dec-2016Minimum Distance Estimation for the Generalized Pareto DistributionPiao Chen ; Zhisheng Ye ; Xingqiu Zhao
1224-Mar-2017Monitoring the Shape Parameter of the Weibull Renewal ProcessCai Wen Zhang; Zhisheng Ye ; Min Xie
1325-Dec-2017Optimal Inspection and Replacement Policies for Multi-Unit Systems Subject to DegradationQiuzhuang Sun ; Zhisheng Ye ; Nan Chen 
1421-Jul-2017Robust Degradation Analysis With Non-Gaussian Measurement ErrorsZHAI QINGQING ; YE ZHISHENG 
1521-Mar-2017RUL Prediction of Deteriorating Products Using An Adaptive Wiener Process ModelZHAI QINGQING ; YE ZHISHENG 
169-Apr-2018Uncertainty quantification for monotone stochastic degradation modelsPiao Chen ; Zhi-sheng Ye