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Ziv Hameiri

rp06175

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Profile

Full Name
Ziv Hameiri
(not current staff)
Variants
Hameiri, Z.
 
Main Affiliation
 
Faculty
 
Email
serzh@nus.edu.sg
 

Publications

Results 1-10 of 10 (Search time: 0.009 seconds).

Issue DateTitleAuthor(s)
1201318.7% Efficient inline-diffused screen-printed silicon wafer solar cells with deep homogeneous emitter etch-backKanti Basu, P. ; Hameiri, Z. ; Sarangi, D. ; Cunnusamy, J.; Carmona, E.; Boreland, M.B. 
22014Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurementsHameiri, Z. ; Rougieux, F.; Sinton, R.; Trupke, T.
3Aug-2013Effective bulk doping concentration of diffused and undiffused silicon wafers obtained from combined photoconductance and photoluminescence measurementsHameiri, Z. ; Trupke, T.; Gao, N.; Sinton, R.A.; Weber, J.W.
42013Evaluation of recombination processes using the local ideality factor of carrier lifetime measurementsHameiri, Z. ; McIntosh, K.; Xu, G.
52013Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetimeBlum, A.L.; Swirhun, J.S.; Sinton, R.A.; Yan, F.; Herasimenka, S.; Roth, T.; Lauer, K.; Haunschild, J.; Lim, B.; Bothe, K.; Hameiri, Z. ; Seipel, B.; Xiong, R.; Dhamrin, M.; Murphy, J.D.
6Jan-2014Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetimeBlum, A.L.; Swirhun, J.S.; Sinton, R.A.; Yan, F.; Herasimenka, S.; Roth, T.; Lauer, K.; Haunschild, J.; Lim, B.; Bothe, K.; Hameiri, Z. ; Seipel, B.; Xiong, R.; Dhamrin, M.; Murphy, J.D.
72013On the use of local ideality factor obtained from effective carrier lifetime measurementsHameiri, Z. ; McIntosh, K.R.
8Mar-2014The impact of SiO2/SiN\rm x stack thickness on laser doping of silicon solar cellXu, L.; Weber, K.; Fell, A.; Hameiri, Z. ; Phang, S.P.; Yang, X.; Franklin, E.
92013Uncertainty in photoconductance measurements of the emitter saturation currentThomson, A.F.; Hameiri, Z. ; Grant, N.E.; Price, C.J.; Di, Y.; Spurgin, J.
102012Uncertainty in photoluminescence-based effective carrier lifetime measurementsHameiri, Z. ; McIntosh, K.R.; Trupke, T.