1. ScholarBank@NUS

Gong Hao

rp01924

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

Refined By:
Department:  MATERIALS SCIENCE
Date Issued:  [1995 TO 1999]
Date Issued:  1998

Results 1-7 of 7 (Search time: 0.002 seconds).

Issue DateTitleAuthor(s)
13-Mar-1998Anisothermal oxidation of micro-crystalline Ni-20Cr-5Al alloy coating at 850-1280°CLiu, Z.; Gao, W.; Gong, H. 
21998Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurementCha, C.L.; Chor, E.F. ; Gong, H. ; Teo, T.H.; Zhang, A.Q.; Chan, L.
31998Evaluation of the dielectric breakdown of reoxidized nitrided oxide (ONO) in flash memory devices using constant current-stressing techniqueCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.; Xie, J.
415-Jul-1998Morphology and magnetic analysis of MnSb films grown by hot-wall epitaxyLow, B.L.; Ong, C.K. ; Han, G.C. ; Gong, H. ; Liew, T.Y.F. ; Tatsuoka, H.; Kuwabara, H.; Yang, Z.
56-Mar-1998The effect of Al3+, Na+ and Li+ impurities on the charging ability of single-crystalline quartz under electron beam irradiationSong, Z.G.; Gong, H. ; Ong, C.K. 
61998Threshold voltage instabilities of fresh flash memory devices caused by plasma chargingCha, C.L.; Chor, E.F. ; Gong, H. ; Teo, T.H.; Zhang, A.Q.; Chan, L.
71998Variation of the relative permittivity of charged dielectricsOng, C.K. ; Song, Z.G.; Oh, K.H. ; Gong, H. ; Le Gressus, C.