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Gong Hao

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

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Department:  MATERIALS SCIENCE
Author:  Gong, H.
Date Issued:  1998

Results 1-7 of 7 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
13-Mar-1998Anisothermal oxidation of micro-crystalline Ni-20Cr-5Al alloy coating at 850-1280°CLiu, Z.; Gao, W.; Gong, H. 
21998Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurementCha, C.L.; Chor, E.F. ; Gong, H. ; Teo, T.H.; Zhang, A.Q.; Chan, L.
31998Evaluation of the dielectric breakdown of reoxidized nitrided oxide (ONO) in flash memory devices using constant current-stressing techniqueCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.; Xie, J.
415-Jul-1998Morphology and magnetic analysis of MnSb films grown by hot-wall epitaxyLow, B.L.; Ong, C.K. ; Han, G.C. ; Gong, H. ; Liew, T.Y.F. ; Tatsuoka, H.; Kuwabara, H.; Yang, Z.
56-Mar-1998The effect of Al3+, Na+ and Li+ impurities on the charging ability of single-crystalline quartz under electron beam irradiationSong, Z.G.; Gong, H. ; Ong, C.K. 
61998Threshold voltage instabilities of fresh flash memory devices caused by plasma chargingCha, C.L.; Chor, E.F. ; Gong, H. ; Teo, T.H.; Zhang, A.Q.; Chan, L.
71998Variation of the relative permittivity of charged dielectricsOng, C.K. ; Song, Z.G.; Oh, K.H. ; Gong, H. ; Le Gressus, C.