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Issue DateTitleAuthor(s)
1998A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETsAng, D.S. ; Ling, C.H. 
Dec-2002A comprehensive study of indium implantation-induced damage in deep submicrometer nMOSFET: Device characterization and damage assessmentLiao, H.; Ang, D.S. ; Ling, C.H. 
Jan-2004A computational model of a class of gene networks with positive and negative controlsChen, P.C.Y. 
Nov-2006A discrete-event approach to transcription control with dynamic event-controllabilityChen, P.C.Y. 
1-Sep-2006A force-feedback control system for micro-assemblyLu, Z. ; Chen, P.C.Y. ; Ganapathy, A.; Zhao, G. ; Nam, J.; Yang, G.; Burdet, E.; Teo, C. ; Meng, Q.; Lin, W.
Dec-2002A general model for studying effects of interface layers on thermoelectric devices performanceXuan, X.C. ; Ng, K.C. ; Yap, C. ; Chua, H.T. 
Jun-1997A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurementAng, D.S. ; Ling, C.H. 
Nov-2001A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressingAng, D.S. 
Mar-1999A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET'sAng, D.S. ; Ling, C.H. 
Jan-1998A novel experimental technique for the lateral profiling of oxide and interface state charges in hot-hole degraded N-MOSFET'sAng, D.S. ; Ling, C.H. 
10-Oct-2001A REGENERATIVE ADSORPTION PROCESS AND MULTI-REACTOR REGENERATIVE ADSORPTION CHILLERCHUA, HUI TONG ; NG, KIM CHOON ; MALEK, ABDUL ; KASHIWAGI, TAKAO; AKISAWA, ATSUSHI; SAHA, BIDYUT BARAN
15-Jun-2000A REGENERATIVE ADSORPTION PROCESS AND MULTI-REACTOR REGENERATIVE ADSORPTION CHILLERCHUA, HUI TONG ; NG, KIM CHOON ; MALEK, ABDUL ; KASHIWAGI, TAKAO; AKISAWA, ATSUSHI; SAHA, BIDYUT BARAN
Oct-2003A slider-crank experiment to determine the action of static forcesNg, T.W. 
2001A two-stage cuboid-styled thermoelectric cooler with switched polarityXuan, X.C. ; Ng, K.C. ; Yap, C. ; Chua, H.T. 
1998A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET'sAng, D.S. ; Ling, C.H. 
Sep-2002Adsorption characteristics of silica gel + water systemsChua, H.T. ; Ng, K.C. ; Chakraborty, A. ; Oo, N.M.; Othman, M.A.
Apr-2000Aesthetic laser marking assessmentNg, T.W. ; Yeo, S.C.
Mar-2001Aesthetic laser marking assessment using luminance ratiosNg, T.W. ; Yeo, S.C.
31-Aug-2000Aesthetic laser marking assessment using spectrophotometersNg, T.W. ; Yeo, S.C.
20-Feb-2003AN ELECTRO-ADSORPTION CHILLER: A MINIATURIZED COOLING CYCLE WITH APPLICATIONS FROM MICROELECTRONICS TO CONVENTIONAL AIR-CONDITIONINGNG, KIM CHOON ; GORDON, JEFFREY M ; CHUA, HUI TONG ; CHAKRABORTY, ANUTOSH